Changhong Ke
Assistant
Professor
Ph.D., Northwestern University,
2006
Room: EB-R8
Phone:
(607) 777-4782
FAX: (607) 777-4620
E-mail:cke@binghamton.edu
Teaching
/ Research Focus: Nanoelectromechanical systems (NEMS) and
microelectromechanical systems (MEMS), nanomanipulation, multi-physics
modeling, AFM molecule imaging, single molecule force spectroscopy, DNA
mechanics, and DNA damage and repair.
Bio Sketch: Dr. Changhong Ke received his B.S. degree in Mechanical Design and Manufacturing and M.S. degree in Fluid Mechanics from Beijing Institute of Technology in China, and Ph.D. degree in Mechanical Engineering from Northwestern University. His Ph.D. dissertation focused on the development of a carbon nanotube based bistable nanoswitch for applications of memory elements and sensors. After finishing his Ph.D., he worked as a postdoctoral fellow at Duke University, where he conducted research on the topics of measuring DNA/RNA elasticity using AFM based single molecule force spectroscopy and detecting radiation induced DNA damage at the single molecule level by AFM imaging and pulling measurements. Dr. Ke is a member of ASME and BPS.
Publications:
Refereed
Journal Papers
12. C.-H. Ke, Y. Jiang, P.A. Mieczkowski, G.G. Muramoto, J.P. Chute, and P.E. Marszalek, “Nanoscale Detection of Ionizing Radiation Damage to DNA by Atomic Force Microscopy,” Small, Vol. 4, pp. 288-294, 2008.
11. C.-H. Ke, M. Humeniuk, Hanna S-Gracz, P. E. Marszalek, “Direct Measurements of Base Stacking Interactions in DNA by Single-Molecule Atomic Force Spectroscopy,” Physical Review Letters, Vol. 99, pp. 018302, 2007.
10. Y. Jiang, C.-H. Ke, P.A. Mieczkowski, and P. E. Marszalek, “Detecting Ultraviolet Damage in Single DNA Molecules by Atomic Force Microscopy,” Biophysical Journal, Vol.93, pp.175-1767, 2007.
9. C.-H. Ke, Y. Jiang, M. Rivera, R. L. Clark, P. E. Marszalek, “Pulling Geometry Induced Errors in Single Molecule Force Spectroscopy Measurements,” Biophysical Journal-Biophysical Letters, Vol. 92, pp.L76-L78, 2007.
8. Y. Zhu, C.-H. Ke and H.D. Espinosa, “Experimental Techniques for the Mechanical Characterization of One-Dimensional Nanostructures,” Experimental mechanics, Vol. 47, pp.7-24, 2007.
7. C.-H. Ke and H.D. Espinosa, “In-situ Electron Microscopy Electro-Mechanical Char-acterization of a NEMS Bistable Device,” Small, Vol. 2, pp. 1484-1489, 2006.
6. K.-H. Kim, N. Moldovan, C.-H. Ke, H. D. Espinosa, X. Xiao, J. Carlisle, O. Auciello, “Novel Ultrananocrystalline Diamond Probes for High Resolution Low-Wear Nanolithographic Techniques,” Small, Vol.1, pp. 866-874, 2005.
5. C.-H. Ke, N. Pugno, B. Peng, and H. D. Espinosa, “Experiments and Modeling of Carbon Nanotube Based NEMS devices,” Journal of the Mechanics and Physics of Solids, Vol. 53, pp.1314-1333, 2005.
4. N. Pugno, C.-H. Ke, and H. D. Espinosa, “Analysis of Doubly-Clamped Nanotube Devices in Finite Deformation Regime,” Journal of Applied Mechanics, Vol.72, pp.445-449, 2005.
3. C.-H. Ke, H. D. Espinosa and N. Pugno, “Numerical Analysis of Nanotube Based NEMS Devices. Part II: Role of Finite Kinematics, Stretching and Charge Concentrations,” Journal of Applied Mechanics, Vol. 72, pp.726-731, 2005.
2. C.-H. Ke and H.D. Espinosa, “Numerical Analysis of Nanotube Based NEMS Devices. Part I: Electrostatic Charge Distribution on Multiwalled Nanotubes,” Journal of Applied Mechanics, Vol. 72, pp.721-725, 2005.
1. C.-H. Ke and H.D. Espinosa, “Feedback Controlled Nanocantilever Device,” Applied Physics Letters, Vol. 85, pp.681-683, 2004.
Book Chapters
3. C.-H. Ke and H.D. Espinosa, "Nanoelectromechanical Systems (NEMS) and Modeling," chapter 121 in the Handbook of Theoretical and Computational Nanotechnology, American Scientific Publishers, 2006.
2. H.D. Espinosa and C.-H. Ke, "Nanoelectromechanical Systems - Experiments and Modeling," Applied Scanning Probe Methods, Vol. 5-7 Edited by B. Bhushan, H. Fuchs, and S. Kawata, Springer-Verlag, Heidelberg, 2006.
1. H.D. Espinosa, C.-H. Ke and N. Pugno, "Nanoelectromechanical Systems (NEMS): Device and Modeling," Encyclopedia of Materials: Science and Technology, editor-in-chief Dr. Patrick Veyssičre, Elsevier, 2005.